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Ion Irradiation Facility - L
Description
The IIF-L is an ion irradiation facility for experiments with various ion types from low-charged ions or molecule fragments up to highly charged ions. It can be equipped with different DREEBIT ion sources such as a Dresden EBIS/T or Dresden ECRIS. Depending on the ion source operation mode, continuous ion beams or ion pulses are transported through the beamline using ion optical elements (Einzel lenses, deflector elements) and ion beam diagnostics (Faraday cups). Ion species separation is realized by a double focusing dipole magnet.
The ion source and the complete beamline are mounted on a high voltage terminal to enable ion deceleration or acceleration towards a grounded target chamber. To focus the ions and transport them into the target chamber without substantial losses a deceleration lens system is mounted at the end of the high voltage tract. In this way, targets can be irradiated with ion energies from ~100 V·q up to 40 kV·q, q being the ion charge state. The complete ion beamline, the ion source, as well as the target chamber are all designed for ultra high vacuum operation. A LabView based command and control system is delivered to operate the IIF-L via computer and automatically analyze the produced spectrum of ions.
The following table gives an overview of typical ion output values of the facility equipped with a Dresden EBIS-A. The values depend on the chosen source parameters which were optimized for each individual charge state in the given table. Higher and lower ion outputs are possible if another ion source is chosen. The values were recorded before deceleration into the target chamber.
Ion Species | Ions / s (DC) | Ions / s (Pulsed) |
H+ (fully ionized) | 2 · 1010 | 1 · 1010 at 100 Hz |
H2+ | 2 · 1010 | |
He2+ (fully ionized) | 6 · 108 | |
C4+ (He-like) | 1 · 109 at 2 Hz | |
C6+ (fully ionized) | 1 · 108 at 2 Hz | |
Ar+ | 2 · 109 | |
Ar8+ (Ne-like) | 2 · 108 | 1 · 108 at 10 Hz |
Ar16+ (He-like) | 7 · 106 at 1 Hz | |
Ar18+ (fully ionized) | 1 · 105 at 1 Hz | |
Kr26+ (Ne-like) | 2 · 106 | |
Xe44+ (Ne-like) | 6 · 104 at 0.2 Hz | |
Au51+ (Ni-like) | 7 · 105 at 1.4 Hz | |
Au60+ | 4 · 103 at 0.4 Hz |
Technical Parameters
Title | Text |
---|---|
Facility Parameters | |
source potential | ca. 1 kV up to 20 kV (depending on ion source type) |
deceleration potential | up to 20 kV |
ion energy at target chamber | ~100 eV·q up to 40 keV·q; q = charge state |
ion pulse width | 50 ns up to 100 μs (depending on ion source type) |
General Parameters | |
dimensions (length x width x height) | 5 m x 4.5 m x 3 m |
weight | ~ 1000 kg |
Infrastructural Reqirements | |
cooling water | multiple deionized water circuits, 1.5 l / min at 3 bar each |
electrical power consumption | up to 15 kW (depending on source type) |
Scope of Delivery
- ion source of the EBIS/T or ECRIS type
- beamline with ion optical elements and Faraday cups for beam transportation
- dipole bending magnet for ion species separation
- ion deceleration lens system
- target chamber
- beamline support rack
- control racks equipped with all power supplies required for the operation of the IIF-L
- remote control system including computer and software
- high voltage protection shielding for beamline and racks
Optional Equipment
- beryllium window for inline x-ray spectroscopy at the ion source
- spare electron gun for EBIS/T ion sources
- additional ion beam diagnostics such as pepperpot emittance meter or retarding eld analyzer
- Metal Ion injection from Volatile Compounds (MIVoC) kit
- metal ion injection kit including pulsed quadrupole beam bender and liquid metal ion source
- target chamber equipment such as sample holders, linear feedthroughs, load lock, etc.
- heating equipment including temperature control for the entire beamline
Downloads
- ProductSheet_IIF-L.pdf (593.70 KiB)