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Beam Optics

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Select individual elements to build or complete your charged particle beamline.
Elements for Electrostatic Charged Particle Beam Focussing
Einzel lenses are ion optical beamline components for charged particle guiding and focusing suitable for high vacuum and ultra high vacuum environment.
Read MoreElements for Electrostatic Charged Particle Beam Deflection
Electrostatic deflectors are elements for charged particle guiding and deflection in beamlines. The deflector system consists of four separated segments, two for horizontal (X) and two for vertical (Y) deflection. We offer various designs to suit specific customers needs.
Read MoreElectrostatic ±90° Deflection of Charged Particle Beams
The DREEBIT Quadrupole Beam Bender is an ion optical device designed to bend charged particles by an angle of up to ±90°. The deflection is realized by quarter-pipe electrodes in a typical vertical electrostatic quadrupole arrangement.
Read MoreMagnetic Charged Particle Beam Deflection
Magnetic steerers are devices for small-angle correction of charged particle beam trajectories. They are suitable for high-current applications.
Read MoreSeparation of Neutral Particles from Charged Particle Beams
The neutral particle beam dump is applied for the separation of neutral particles like atoms or molecules from beams of charged particles by 25° deflection.
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