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X-ray spectroscopy of highly charged ions
Since the electron energy can be adjusted the Dresden EBIT/EBIS are excellent sources of specific electromagnetic radiation such as
- X-rays
- ultraviolett, EUV
- visible light
The signature of the radiation can be used for diagnostics of the ion trap comparing the measured x-ray transitions with atomic structure calculations.
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For x-ray detection we are using an energy-dispersive Si(Li) detector as well as a wavelength-dispersive
crystal diffraction spectrometer with a set of different analysator crystals and a charge coupled device
(CCD) camera detector.
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