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TERX-Detection System
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| product name: | TERX-Detection System |
| product category: | X-Ray spectrometry |
| catalog no.: | 22006 |
| datasheet: |  n/a |
The measurement of X-Ray spectra in dependency of the ionization time allows to study the time development of the ion charge state distribution inside of ion traps. The time-resolved X-Ray spectrometry of dielectronic recombination, radiative recombination and lines of direct excitation processes gives the possibility to analyse the time development of individual ion charge states.
The figure shows the scheme of DREEBIT’s TERX (Time and Energy resolved X-Ray)-Detection System. The core (cRiO-system) consists of a cRiO-controller, different I/O modules and a FPGA Back-Plane (Field Programmable Gate Array), which coordinates all time-critical tasks.
The parallel architecture of the FPGA allows, that information of other channels (than data channels) can be sent and received simultaneously to the capture of X-Ray events. This makes the
measurement of time- and energy-resolved X-Ray data feasible.
The TERX-Detection System can detect X-Ray spectra at Electron Beam Ion Sources time resolved and at different electron energies. The data can be processed, used to create graphs and saved for further applications. The operation of the system with different X-Ray detectors is possible by just adding a parallel port to the detector controller.
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