| Ion source: | |
Dresden EBIS-SC
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about this ion source | |
Dresden EBIS-A
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about this ion source | | 
Dresden EBIS
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Dresden EBIT
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about this ion source |  | detection method:
x-ray spectra /
wavelength dispersive x-ray spectra
date:
2006-11-01
more information:
Titanium crystal diffraction spectrum measured with a plane SiO2 (1011) crystal;
electron energy 13.0 keV;
electron beam current 30 mA;
pressure 2x10-9 mbar;
|
|  | detection method:
x-ray spectra /
energy dispersive x-ray spectra
date:
2006-11-01
more information:
| Titanium x-ray spectrum measured with a Si(Li) semiconductor x-ray detector (FWHM=133 eV at 5.9 keV) at Ee= 14.5 keV. |
|  | detection method:
x-ray spectra /
wavelength dispersive x-ray spectra
date:
2005-01-07
more information:
electron energy 8 keV;
electron beam current 30 mA;
pressure 2x10-9 mbar;
ionization time 1000ms;
flat crystal spectrometer |
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