the company news history contact find us cooperations and partnerships jobs technology highly charged ions applications ion sources produced ions x-ray spectroscopy publications vacuum service electronic high vacuum fine vacuum cleanroom decontamination service contracts second hand products products my products ion sources irradiation facilities spectrometer components equipment & supplies reference facilities	Ion spectra of Argon [Z=18] Ion source: Dresden EBIS-SC find more information about this ion source Dresden EBIS-A find more information about this ion source detection method: extraction spectra / leaky mode date: 2010-02-08 more information: Argon ion extraction spectrum measured in leaky mode U_0 = 8592 V U_A = - 300 V U_B = - 220 V U_C = - 2997 V I_e = 60 mA detection method: extraction spectra / leaky mode date: 2008-Jan-08 more information: electron energy 15 keV electron beam current 62 mA vacuum pressure 3x10-9 mbar detection method: x-ray spectra / energy dispersive x-ray spectra date: 2007-05-19 more information: Si(Li) detector; energy resolution 133 eV at 6 keV; time development of Ar16+; electron energy 8 keV; electron beam current 70 mA; pressure 2x10-9 mbar; ionization time 0-2000 ms detection method: extraction spectra / pulsed mode date: 2006-11-28 more information: electron energy 10.5 keV electron beam current 76 mA pressure 1x10-9 mbar ionization time 2000 ms trap potential 100 V detection method: extraction spectra / leaky mode date: 2006-11-01 more information: Dresden EBIS find more information about this ion source Dresden EBIT find more information about this ion source detection method: extraction spectra / pulsed mode date: 2008-Jan-08 more information: electron energy 11 keV electron beam current 30 mA vacuum pressure 2x10-9 mbar ionization time 100 ms (blue curve) ionization time 1000 ms (black curve) detection method: x-ray spectra / energy dispersive x-ray spectra date: 2008-Jan-08 more information: electron energy 11 keV electron beam current 26 mA vacuum pressure 2x10-9 mbar ionization time 2000 ms detection method: x-ray spectra / energy dispersive x-ray spectra date: 2008-Jan-08 more information: electron energy 11 keV electron beam current 30 mA vacuum pressure 1x10-9 mbar ionization time 2000 ms detection method: x-ray spectra / energy dispersive x-ray spectra date: 2008-Jan-08 more information: electron energy 11 keV electron beam current 30 mA vacuum pressure 2x10-9 mbar ionization time 1000 ms detection method: x-ray spectra / energy dispersive x-ray spectra date: 2008-Jan-08 more information: electron energy 11 keV electron beam current 30 mA vacuum pressure 1.5x10-9 mbar ionization time 1000 ms detection method: x-ray spectra / energy dispersive x-ray spectra date: 2006-11-01 more information: Argon crystal diffractions spectrum measured with a plane SiO2 (1011) crystal at Ee=13.0 keV detection method: extraction spectra / pulsed mode date: 2006-11-01 more information: detection method: x-ray spectra / energy dispersive x-ray spectra date: 2006-11-01 more information: Argon x-ray spectrum measured with a Si(Li) semiconductor x-ray detector (FWHM=133 eV at 5.9 keV) at Ee=8 keV detection method: extraction spectra / pulsed mode date: 2006-11-01 more information: electron energy 11 keV electron beam current 30 mA vacuum pressure 2x10-9 mbar ionization time 100 ms (blue curve) ionization time 1000 ms (black curve) << go back     print
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